IFJ PAN, home-made atomic force microscopy


  • Maximum scan range in X-Y plane: 100 μm x 100 μm;
  • Maximum Z range: 50 μm;
  • Working modes: contact AFM, LFM, force spectroscopy;

The microscope is equipped with liquid cell setup working at room temperature. Top view optics (Nikon) is used to observe sample surface.

Home-made AFM working at the IFJ PAN in Cracow (side and top vies).